This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards Guides and Remendations issued by the World Trade Organization Technical Barriers to Trade (TBT)Committee. Designation:E2534-20 INTERNATIONAL Standard Practice for Targeted Defect Detection Using Process Compensated Resonance Testing Via Swept Sine Input for Metallic and Non-Metallic Parts This standard is issued under the fixed designation E2534;the number immediately following the designation indicates the year of original adoption or in the case of revision the year of last revision.A number in parentheses indicates the year of last reapproval.A superscript cpsilon (a)indicates an cditorial change sincc the last revision or rcapproval. 1.Scope* 2.Referenced Documents 1.1 This practice describes a general procedure for using the 2.1 ASTM Standards:2 process pensated resonance testing (PCRT)via swept sine E1316 Terminology for Nondestructive Examinations input method for metallic or non-metallic parts to pare E2001 Guide for Resonant Ultrasound Spectroscopy for resonance patterns from a sample under test to reference Defect Detection in Both Metallic and Non-metallic Parts teaching sets of known acceptable and targeted defect samples. E3081 Practice for Outlier Screening Using Process Com- The resonance pattern differences can be used to distinguish pensated Reso...
ASTM E2534-20 金属和非金属零件用扫频正弦输入过程补偿共振试验进行目标缺陷检测的标准实施规程.pdf
